Feng Xie, Xiaoyao Liang, Qiang Xu, Krishnendu Chakrabarty, Naifeng Jing, Li Jiang
Jump test for metallic CNTs in CNFET-based SRAM
DAC, 2015.
@inproceedings{DAC-2015-XieLXCJJ,
author = "Feng Xie and Xiaoyao Liang and Qiang Xu and Krishnendu Chakrabarty and Naifeng Jing and Li Jiang",
booktitle = "{Proceedings of the 52nd Annual Design Automation Conference}",
doi = "10.1145/2744769.2744864",
isbn = "978-1-4503-3520-1",
pages = "6",
publisher = "{ACM}",
title = "{Jump test for metallic CNTs in CNFET-based SRAM}",
year = 2015,
}