Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits Based on Vector Restoration
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Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy
Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits Based on Vector Restoration
DATE, 1998.

DATE 1998
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@inproceedings{DATE-1998-GuoPR,
	author        = "Ruifeng Guo and Irith Pomeranz and Sudhakar M. Reddy",
	booktitle     = "{Proceedings of the Third Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.1998.655917",
	pages         = "583--587",
	publisher     = "{IEEE Computer Society}",
	title         = "{Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits Based on Vector Restoration}",
	year          = 1998,
}

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