BibSLEIGH — Design-for-Testability for Synchronous Sequential Circuits using Locally Available Lines

Irith Pomeranz, Sudhakar M. Reddy
Design-for-Testability for Synchronous Sequential Circuits using Locally Available Lines
DATE, 1998.

DATE 1998

@inproceedings{DATE-1998-PomeranzR98a,
	author        = "Irith Pomeranz and Sudhakar M. Reddy",
	booktitle     = "{Proceedings of the Third Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.1998.656000",
	pages         = "983--984",
	publisher     = "{IEEE Computer Society}",
	title         = "{Design-for-Testability for Synchronous Sequential Circuits using Locally Available Lines}",
	year          = 1998,
}

Irith Pomeranz, Sudhakar M. ReddyDesign-for-Testability for Synchronous Sequential Circuits using Locally Available LinesDATE, 1998.

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Irith Pomeranz, Sudhakar M. Reddy
Design-for-Testability for Synchronous Sequential Circuits using Locally Available Lines
DATE, 1998.