Minimal Length Diagnostic Tests for Analog Circuits using Test History
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Alfred V. Gomes, Abhijit Chatterjee
Minimal Length Diagnostic Tests for Analog Circuits using Test History
DATE, 1999.

DATE 1999
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@inproceedings{DATE-1999-GomesC,
	author        = "Alfred V. Gomes and Abhijit Chatterjee",
	booktitle     = "{Proceedings of the Fourth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.1999.761120",
	isbn          = "0-7695-0078-1",
	pages         = "189--194",
	publisher     = "{IEEE Computer Society}",
	title         = "{Minimal Length Diagnostic Tests for Analog Circuits using Test History}",
	year          = 1999,
}

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