At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks
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Jongchul Shin, Hyunjin Kim, Sungho Kang
At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks
DATE, 1999.

DATE 1999
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@inproceedings{DATE-1999-ShinKK,
	author        = "Jongchul Shin and Hyunjin Kim and Sungho Kang",
	booktitle     = "{Proceedings of the Fourth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.1999.761168",
	isbn          = "0-7695-0078-1",
	pages         = "473--None",
	publisher     = "{IEEE Computer Society}",
	title         = "{At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks}",
	year          = 1999,
}

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