Sungju Park, Taehyung Kim
A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects
DATE, 2000.
@inproceedings{DATE-2000-ParkK,
author = "Sungju Park and Taehyung Kim",
booktitle = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2000.840311",
isbn = "0-7695-0537-6",
pages = "458--462",
publisher = "{IEEE Computer Society}",
title = "{A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects}",
year = 2000,
}