Travelled to:
1 × France
Collaborated with:
S.Park
Talks about:
boundari (1) detect (1) design (1) defect (1) delay (1) scan (1) ieee (1) new (1)
Person: Taehyung Kim
DBLP: Kim:Taehyung
Contributed to:
Wrote 1 papers:
- DATE-2000-ParkK #bound #design #detection #fault
- A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects (SP, TK), pp. 458–462.