Efficient test data compression and decompression for system-on-a-chip using internal scan chains and Golomb coding
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Anshuman Chandra, Krishnendu Chakrabarty
Efficient test data compression and decompression for system-on-a-chip using internal scan chains and Golomb coding
DATE, 2001.

DATE 2001
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@inproceedings{DATE-2001-ChandraC,
	author        = "Anshuman Chandra and Krishnendu Chakrabarty",
	booktitle     = "{Proceedings of the Sixth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1145/367072.367125",
	isbn          = "0-7695-0993-2",
	pages         = "145--149",
	publisher     = "{ACM}",
	title         = "{Efficient test data compression and decompression for system-on-a-chip using internal scan chains and Golomb coding}",
	year          = 2001,
}

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