Irith Pomeranz, Sudhakar M. Reddy
Definitions of the numbers of detections of target faults and their effectiveness in guiding test generation for high defect coverage
DATE, 2001.
@inproceedings{DATE-2001-PomeranzR01a,
author = "Irith Pomeranz and Sudhakar M. Reddy",
booktitle = "{Proceedings of the Sixth Conference on Design, Automation and Test in Europe}",
doi = "10.1145/367072.367342",
isbn = "0-7695-0993-2",
pages = "504--508",
publisher = "{ACM}",
title = "{Definitions of the numbers of detections of target faults and their effectiveness in guiding test generation for high defect coverage}",
year = 2001,
}