Zaid Al-Ars, A. J. van de Goor, Jens Braun, Detlev Richter
Optimizing Stresses for Testing DRAM Cell Defects Using Electrical Simulation
DATE, 2003.
@inproceedings{DATE-2003-Al-ArsGBR,
acmid = "1022774",
author = "Zaid Al-Ars and A. J. van de Goor and Jens Braun and Detlev Richter",
booktitle = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2003.10016",
isbn = "0-7695-1870-2",
pages = "10484--10489",
publisher = "{IEEE Computer Society}",
title = "{Optimizing Stresses for Testing DRAM Cell Defects Using Electrical Simulation}",
year = 2003,
}