Travelled to:1 × Germany
Collaborated with:Z.Al-Ars A.J.v.d.Goor D.Richter
Talks about:stress (1) electr (1) defect (1) simul (1) optim (1) test (1) dram (1) cell (1) use (1)
Person: Jens Braun
DBLP: Braun:Jens
Contributed to:
2003Wrote 1 papers:
- DATE-2003-Al-ArsGBR #fault #optimisation #simulation #testing #using
- Optimizing Stresses for Testing DRAM Cell Defects Using Electrical Simulation (ZAA, AJvdG, JB, DR), pp. 10484–10489.