Zhiyuan He, Zebo Peng, Petru Eles
Power constrained and defect-probability driven SoC test scheduling with test set partitioning
DATE, 2006.
@inproceedings{DATE-2006-HePE,
author = "Zhiyuan He and Zebo Peng and Petru Eles",
booktitle = "{Proceedings of the 10th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1131562",
pages = "291--296",
publisher = "{European Design and Automation Association, Leuven, Belgium}",
title = "{Power constrained and defect-probability driven SoC test scheduling with test set partitioning}",
year = 2006,
}