Tetsuya Iizuka, Makoto Ikeda, Kunihiro Asada
Timing-driven cell layout de-compaction for yield optimization by critical area minimization
DATE, 2006.
@inproceedings{DATE-2006-IizukaIA,
author = "Tetsuya Iizuka and Makoto Ikeda and Kunihiro Asada",
booktitle = "{Proceedings of the 10th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1131731",
pages = "884--889",
publisher = "{European Design and Automation Association, Leuven, Belgium}",
title = "{Timing-driven cell layout de-compaction for yield optimization by critical area minimization}",
year = 2006,
}