C. Sebeke, C. Jung, Klaus Harbich, S. Fuchs, J. Schwarz, Peter Göhner
Test and reliability challenges in automotive microelectronics
DATE, 2006.
@inproceedings{DATE-2006-SebekeJHFSG,
author = "C. Sebeke and C. Jung and Klaus Harbich and S. Fuchs and J. Schwarz and Peter Göhner",
booktitle = "{Proceedings of the 10th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1131630",
pages = "547",
publisher = "{European Design and Automation Association, Leuven, Belgium}",
title = "{Test and reliability challenges in automotive microelectronics}",
year = 2006,
}