Travelled to:
1 × Germany
Collaborated with:
C.Sebeke K.Harbich S.Fuchs J.Schwarz P.Göhner
Talks about:
microelectron (1) challeng (1) reliabl (1) automot (1) test (1)
Person: C. Jung
DBLP: Jung:C=
Contributed to:
Wrote 1 papers:
- DATE-2006-SebekeJHFSG #challenge #reliability
- Test and reliability challenges in automotive microelectronics (CS, CJ, KH, SF, JS, PG), p. 547.