Tomokazu Yoneda, Kimihiko Masuda, Hideo Fujiwara
Power-constrained test scheduling for multi-clock domain SoCs
DATE, 2006.
@inproceedings{DATE-2006-YonedaMF,
author = "Tomokazu Yoneda and Kimihiko Masuda and Hideo Fujiwara",
booktitle = "{Proceedings of the 10th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1131563",
pages = "297--302",
publisher = "{European Design and Automation Association, Leuven, Belgium}",
title = "{Power-constrained test scheduling for multi-clock domain SoCs}",
year = 2006,
}