Quming Zhou, Kedarnath J. Balakrishnan
Test cost reduction for SoC using a combined approach to test data compression and test scheduling
DATE, 2007.
@inproceedings{DATE-2007-ZhouB,
author = "Quming Zhou and Kedarnath J. Balakrishnan",
booktitle = "{Proceedings of the 11th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1266366.1266377",
isbn = "978-3-9810801-2-4",
pages = "39--44",
publisher = "{ACM}",
title = "{Test cost reduction for SoC using a combined approach to test data compression and test scheduling}",
year = 2007,
}