A sparse grid based spectral stochastic collocation method for variations-aware capacitance extraction of interconnects under nanometer process technology
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Hengliang Zhu, Xuan Zeng, Wei Cai, Jintao Xue, Dian Zhou
A sparse grid based spectral stochastic collocation method for variations-aware capacitance extraction of interconnects under nanometer process technology
DATE, 2007.

DATE 2007
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@inproceedings{DATE-2007-ZhuZCXZ,
	author        = "Hengliang Zhu and Xuan Zeng and Wei Cai and Jintao Xue and Dian Zhou",
	booktitle     = "{Proceedings of the 11th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1145/1266366.1266698",
	isbn          = "978-3-9810801-2-4",
	pages         = "1514--1519",
	publisher     = "{ACM}",
	title         = "{A sparse grid based spectral stochastic collocation method for variations-aware capacitance extraction of interconnects under nanometer process technology}",
	year          = 2007,
}

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