Yanjing Li, Samy Makar, Subhasish Mitra
CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns
DATE, 2008.
@inproceedings{DATE-2008-LiMM,
author = "Yanjing Li and Samy Makar and Subhasish Mitra",
booktitle = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2008.4484786",
isbn = "978-3-9810801-3-1",
pages = "885--890",
publisher = "{IEEE}",
title = "{CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns}",
year = 2008,
}











