Travelled to:
1 × France
1 × Germany
Collaborated with:
S.Mitra S.Makar Xin-Chuan Wu T.Sherwood F.T.Chong D.Lin T.Hong F.Fallah D.S.Gardner N.Hakim
Talks about:
test (2) use (2) challeng (1) silicon (1) protect (1) pointer (1) pattern (1) overcom (1) monoton (1) concurr (1)
Person: Yanjing Li
DBLP: Li:Yanjing
Contributed to:
Wrote 3 papers:
- DATE-2013-LinHLFGHM #challenge #detection #fault #validation
- Overcoming post-silicon validation challenges through quick error detection (QED) (DL, TH, YL, FF, DSG, NH, SM), pp. 320–325.
- DATE-2008-LiMM #concurrent #named #self #using
- CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns (YL, SM, SM), pp. 885–890.
- ASPLOS-2019-WuSCL #pointer #using
- Protecting Page Tables from RowHammer Attacks using Monotonic Pointers in DRAM True-Cells (XCW, TS, FTC, YL), pp. 645–657.