Travelled to:
1 × Germany
Collaborated with:
Y.Li S.Mitra
Talks about:
test (2) pattern (1) concurr (1) autonom (1) store (1) self (1) chip (1) casp (1) use (1)
Person: Samy Makar
DBLP: Makar:Samy
Contributed to:
Wrote 1 papers:
- DATE-2008-LiMM #concurrent #named #self #using
- CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns (YL, SM, SM), pp. 885–890.