Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D. Blanton
Physically-Aware N-Detect Test Pattern Selection
DATE, 2008.
@inproceedings{DATE-2008-LinPBB,
author = "Yen-Tzu Lin and Osei Poku and Naresh K. Bhatti and Ronald D. Blanton",
booktitle = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2008.4484748",
isbn = "978-3-9810801-3-1",
pages = "634--639",
publisher = "{IEEE}",
title = "{Physically-Aware N-Detect Test Pattern Selection}",
year = 2008,
}