Physically-Aware N-Detect Test Pattern Selection
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Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D. Blanton
Physically-Aware N-Detect Test Pattern Selection
DATE, 2008.

DATE 2008
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@inproceedings{DATE-2008-LinPBB,
	author        = "Yen-Tzu Lin and Osei Poku and Naresh K. Bhatti and Ronald D. Blanton",
	booktitle     = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2008.4484748",
	isbn          = "978-3-9810801-3-1",
	pages         = "634--639",
	publisher     = "{IEEE}",
	title         = "{Physically-Aware N-Detect Test Pattern Selection}",
	year          = 2008,
}

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