Travelled to:1 × Germany
3 × USA
Collaborated with:W.C.Tam R.D.(.Blanton R.D.Blanton Y.Lin N.K.Bhatti H.Wang X.Yu S.Liu I.Komara
Talks about:diagnosi (3) failur (2) autom (2) test (2) creation (1) pattern (1) circuit (1) analysi (1) select (1) precis (1)
Person: Osei Poku
 DBLP: Poku:Osei
Contributed to:
Wrote 4 papers:
- DAC-2012-WangPYLKB #optimisation #testing
 - Test-data volume optimization for diagnosis (HW, OP, XY, SL, IK, RDB), pp. 567–572.
 - DAC-2009-TamPB #automation #validation
 - Automated failure population creation for validating integrated circuit diagnosis methods (WCT, OP, RD(B), pp. 708–713.
 - DAC-2008-TamPB #analysis #automation #layout #locality #precise #using
 - Precise failure localization using automated layout analysis of diagnosis candidates (WCT, OP, RD(B), pp. 367–372.
 - DATE-2008-LinPBB #detection
 - Physically-Aware N-Detect Test Pattern Selection (YTL, OP, NKB, RDB), pp. 634–639.
 













