Spatial Correlation Extraction via Random Field Simulation and Production Chip Performance Regression
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Bao Liu
Spatial Correlation Extraction via Random Field Simulation and Production Chip Performance Regression
DATE, 2008.

DATE 2008
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@inproceedings{DATE-2008-Liu08a,
	author        = "Bao Liu",
	booktitle     = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2008.4484904",
	isbn          = "978-3-9810801-3-1",
	pages         = "527--532",
	publisher     = "{IEEE}",
	title         = "{Spatial Correlation Extraction via Random Field Simulation and Production Chip Performance Regression}",
	year          = 2008,
}

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