Bao Liu
Spatial Correlation Extraction via Random Field Simulation and Production Chip Performance Regression
DATE, 2008.
@inproceedings{DATE-2008-Liu08a,
author = "Bao Liu",
booktitle = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2008.4484904",
isbn = "978-3-9810801-3-1",
pages = "527--532",
publisher = "{IEEE}",
title = "{Spatial Correlation Extraction via Random Field Simulation and Production Chip Performance Regression}",
year = 2008,
}











