Xrysovalantis Kavousianos, Krishnendu Chakrabarty
Generation of compact test sets with high defect coverage
DATE, 2009.
@inproceedings{DATE-2009-KavousianosC,
author = "Xrysovalantis Kavousianos and Krishnendu Chakrabarty",
booktitle = "{Proceedings of the 13th Conference on Design, Automation and Test in Europe}",
pages = "1130--1135",
publisher = "{IEEE}",
title = "{Generation of compact test sets with high defect coverage}",
year = 2009,
}