Aymen Ladhar, Mohamed Masmoudi, Laroussi Bouzaida
Efficient and accurate method for intra-gate defect diagnoses in nanometer technology and volume data
DATE, 2009.
@inproceedings{DATE-2009-LadharMB,
author = "Aymen Ladhar and Mohamed Masmoudi and Laroussi Bouzaida",
booktitle = "{Proceedings of the 13th Conference on Design, Automation and Test in Europe}",
pages = "988--993",
publisher = "{IEEE}",
title = "{Efficient and accurate method for intra-gate defect diagnoses in nanometer technology and volume data}",
year = 2009,
}











