Towards a chip level reliability simulator for copper/low-k backend processes
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Muhammad Bashir, Linda S. Milor
Towards a chip level reliability simulator for copper/low-k backend processes
DATE, 2010.

DATE 2010
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@inproceedings{DATE-2010-BashirM,
	author        = "Muhammad Bashir and Linda S. Milor",
	booktitle     = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}",
	pages         = "279--282",
	publisher     = "{IEEE}",
	title         = "{Towards a chip level reliability simulator for copper/low-k backend processes}",
	year          = 2010,
}

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