Muhammad Bashir, Linda S. Milor
Towards a chip level reliability simulator for copper/low-k backend processes
DATE, 2010.
@inproceedings{DATE-2010-BashirM, author = "Muhammad Bashir and Linda S. Milor", booktitle = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}", pages = "279--282", publisher = "{IEEE}", title = "{Towards a chip level reliability simulator for copper/low-k backend processes}", year = 2010, }