A. J. van de Goor, Georgi Gaydadjiev, Said Hamdioui
Memory testing with a RISC microcontroller
DATE, 2010.
@inproceedings{DATE-2010-GoorGH, author = "A. J. van de Goor and Georgi Gaydadjiev and Said Hamdioui", booktitle = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}", pages = "214--219", publisher = "{IEEE}", title = "{Memory testing with a RISC microcontroller}", year = 2010, }