Yu Bi, Kees-Jan van der Kolk, Jorge Fernandez Villena, Luis Miguel Silveira, Nick van der Meijs
Fast statistical analysis of RC nets subject to manufacturing variabilities
DATE, 2011.
@inproceedings{DATE-2011-BiKVSM, author = "Yu Bi and Kees-Jan van der Kolk and Jorge Fernandez Villena and Luis Miguel Silveira and Nick van der Meijs", booktitle = "{Proceedings of the 15th Conference on Design, Automation and Test in Europe}", isbn = "978-1-61284-208-0", pages = "31--37", publisher = "{IEEE}", title = "{Fast statistical analysis of RC nets subject to manufacturing variabilities}", year = 2011, }