Travelled to:
1 × France
Collaborated with:
K.v.d.Kolk J.F.Villena L.M.Silveira N.v.d.Meijs
Talks about:
manufactur (1) variabl (1) subject (1) statist (1) analysi (1) fast (1) net (1)
Person: Yu Bi
DBLP: Bi:Yu
Contributed to:
Wrote 1 papers:
- DATE-2011-BiKVSM #analysis #performance #statistics
- Fast statistical analysis of RC nets subject to manufacturing variabilities (YB, KJvdK, JFV, LMS, NvdM), pp. 31–37.