Travelled to:2 × France
Collaborated with:G.S.Garcea N.P.v.d.Meijs R.H.J.M.Otten Y.Bi J.F.Villena L.M.Silveira N.v.d.Meijs
Talks about:statist (2) manufactur (1) variabl (1) subject (1) analysi (1) buffer (1) plan (1) fast (1) awar (1) net (1)
Person: Kees-Jan van der Kolk
DBLP: Kolk:Kees=Jan_van_der
Contributed to:
20112004Wrote 2 papers:
- DATE-2011-BiKVSM #analysis #performance #statistics
- Fast statistical analysis of RC nets subject to manufacturing variabilities (YB, KJvdK, JFV, LMS, NvdM), pp. 31–37.
- DATE-v2-2004-GarceaMKO #statistics
- Statistically Aware Buffer Planning (GSG, NPvdM, KJvdK, RHJMO), pp. 1402–1403.