Vikas Chandra, Robert C. Aitken
Analytical model for SRAM dynamic write-ability degradation due to gate oxide breakdown
DATE, 2011.
@inproceedings{DATE-2011-ChandraA,
author = "Vikas Chandra and Robert C. Aitken",
booktitle = "{Proceedings of the 15th Conference on Design, Automation and Test in Europe}",
isbn = "978-1-61284-208-0",
pages = "1172--1175",
publisher = "{IEEE}",
title = "{Analytical model for SRAM dynamic write-ability degradation due to gate oxide breakdown}",
year = 2011,
}