Analytical model for SRAM dynamic write-ability degradation due to gate oxide breakdown
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Vikas Chandra, Robert C. Aitken
Analytical model for SRAM dynamic write-ability degradation due to gate oxide breakdown
DATE, 2011.

DATE 2011
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@inproceedings{DATE-2011-ChandraA,
	author        = "Vikas Chandra and Robert C. Aitken",
	booktitle     = "{Proceedings of the 15th Conference on Design, Automation and Test in Europe}",
	isbn          = "978-1-61284-208-0",
	pages         = "1172--1175",
	publisher     = "{IEEE}",
	title         = "{Analytical model for SRAM dynamic write-ability degradation due to gate oxide breakdown}",
	year          = 2011,
}


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