@inproceedings{DATE-2012-CaiHMM,
	acmid         = "2492838",
	author        = "Yu Cai and Erich F. Haratsch and Onur Mutlu and Ken Mai",
	booktitle     = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
	isbn          = "978-1-4577-2145-8",
	pages         = "521--526",
	publisher     = "{IEEE}",
	title         = "{Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis}",
	year          = 2012,
}