@inproceedings{DATE-2013-CaiHMM,
	acmid         = "2485597",
	author        = "Yu Cai and Erich F. Haratsch and Onur Mutlu and Ken Mai",
	booktitle     = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
	isbn          = "978-1-4503-2153-2",
	pages         = "1285--1290",
	publisher     = "{EDA Consortium San Jose, CA, USA / ACM DL}",
	title         = "{Threshold voltage distribution in MLC NAND flash memory: characterization, analysis, and modeling}",
	year          = 2013,
}