Zheng Wang, Kapil Singh, Chao Chen, Anupam Chattopadhyay
Accurate and efficient reliability estimation techniques during ADL-driven embedded processor design
DATE, 2013.
@inproceedings{DATE-2013-WangSCC,
acmid = "2485423",
author = "Zheng Wang and Kapil Singh and Chao Chen and Anupam Chattopadhyay",
booktitle = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
isbn = "978-1-4503-2153-2",
pages = "547--552",
publisher = "{EDA Consortium San Jose, CA, USA / ACM DL}",
title = "{Accurate and efficient reliability estimation techniques during ADL-driven embedded processor design}",
year = 2013,
}