Anup Das, Akash Kumar, Bharadwaj Veeravalli, Cristiana Bolchini, Antonio Miele
Combined DVFS and mapping exploration for lifetime and soft-error susceptibility improvement in MPSoCs
DATE, 2014.
@inproceedings{DATE-2014-DasKVBM,
author = "Anup Das and Akash Kumar and Bharadwaj Veeravalli and Cristiana Bolchini and Antonio Miele",
booktitle = "{Proceedings of the 18th Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.7873/DATE.2014.074",
pages = "1--6",
publisher = "{IEEE}",
title = "{Combined DVFS and mapping exploration for lifetime and soft-error susceptibility improvement in MPSoCs}",
year = 2014,
}