Wear-out analysis of Error Correction Techniques in Phase-Change Memory
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Caio Hoffman, Luiz Ramos, Rodolfo Azevedo, Guido Araujo
Wear-out analysis of Error Correction Techniques in Phase-Change Memory
DATE, 2014.

DATE 2014
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@inproceedings{DATE-2014-HoffmanRAA,
	author        = "Caio Hoffman and Luiz Ramos and Rodolfo Azevedo and Guido Araujo",
	booktitle     = "{Proceedings of the 18th Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.7873/DATE.2014.047",
	pages         = "1--4",
	publisher     = "{IEEE}",
	title         = "{Wear-out analysis of Error Correction Techniques in Phase-Change Memory}",
	year          = 2014,
}

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