M. Saliva, F. Cacho, V. Huard, X. Federspiel, D. Angot, A. Benhassain, A. Bravaix, L. Anghel
Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI
DATE, 2015.
@inproceedings{DATE-2015-SalivaCHFABBA,
acmid = "2755854",
author = "M. Saliva and F. Cacho and V. Huard and X. Federspiel and D. Angot and A. Benhassain and A. Bravaix and L. Anghel",
booktitle = "{Proceedings of the 19th Conference and Exhibition on Design, Automation and Test in Europe}",
isbn = "978-3-9815370-4-8",
pages = "441--446",
publisher = "{ACM}",
title = "{Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI}",
year = 2015,
}
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