@inproceedings{DATE-2016-KimHCST,
	author        = "Taeyoung Kim 0001 and Xin Huang 0003 and Hai-Bao Chen and Valeriy Sukharev and Sheldon X.-D. Tan",
	booktitle     = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
	ee            = "http://ieeexplore.ieee.org/document/7459355/",
	isbn          = "978-3-9815-3707-9",
	pages         = "463--468",
	publisher     = "{IEEE}",
	title         = "{Learning-based dynamic reliability management for dark silicon processor considering EM effects}",
	year          = 2016,
}