Fengchao Zhang, Shuo Yang, Jim Plusquellic, Swarup Bhunia
Current based PUF exploiting random variations in SRAM cells
DATE, 2016.
@inproceedings{DATE-2016-ZhangYPB,
author = "Fengchao Zhang and Shuo Yang and Jim Plusquellic and Swarup Bhunia",
booktitle = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
ee = "http://ieeexplore.ieee.org/document/7459321/",
isbn = "978-3-9815-3707-9",
pages = "277--280",
publisher = "{IEEE}",
title = "{Current based PUF exploiting random variations in SRAM cells}",
year = 2016,
}