@inproceedings{DATE-2017-FarahmandiMZNM,
	author        = "Farimah Farahmandi and Ronny Morad and Avi Ziv and Ziv Nevo and Prabhat Mishra 0001",
	booktitle     = "{Proceedings of the 21st Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2017.7927022",
	isbn          = "978-3-9815370-8-6",
	pages         = "392--397",
	publisher     = "{IEEE}",
	title         = "{Cost-effective analysis of post-silicon functional coverage events}",
	year          = 2017,
}