Matthew W. Heath, Wayne P. Burleson, Ian G. Harris
Synchro-Tokens: Eliminating Nondeterminism to Enable Chip-Level Test of Globally-Asynchronous Locally-Synchronous SoC?s
DATE, 2004.
@inproceedings{DATE-v1-2004-HeathBH,
author = "Matthew W. Heath and Wayne P. Burleson and Ian G. Harris",
booktitle = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe, Volume 1}",
doi = "10.1109/DATE.2004.1268881",
isbn = "0-7695-2085-5",
pages = "410--415",
publisher = "{IEEE Computer Society}",
title = "{Synchro-Tokens: Eliminating Nondeterminism to Enable Chip-Level Test of Globally-Asynchronous Locally-Synchronous SoC?s}",
year = 2004,
}