Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts
Status of IEEE Testability Standards 1149.4, 1532 and 1149.6
DATE, 2004.
@inproceedings{DATE-v2-2004-SunterOCJBEBB,
author = "Stephen K. Sunter and Adam Osseiran and Adam Cron and Neil Jacobson and Dave Bonnett and Bill Eklow and Carl Barnhart and Ben Bennetts",
booktitle = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe, Volume 2}",
doi = "10.1109/DATE.2004.1269053",
isbn = "0-7695-2085-5",
pages = "1184--1191",
publisher = "{IEEE Computer Society}",
title = "{Status of IEEE Testability Standards 1149.4, 1532 and 1149.6}",
year = 2004,
}
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