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Travelled to:
1 × Germany
1 × USA
2 × France
Collaborated with:
L.Jiang Q.Xu F.Ye K.Chakrabarty S.K.Sunter A.Osseiran A.Cron N.Jacobson D.Bonnett C.Barnhart B.Bennetts
Talks about:
repair (2) effect (2) stack (2) tsv (2) differenti (1) standard (1) testabl (1) status (1) effici (1) futur (1)

Person: Bill Eklow

DBLP DBLP: Eklow:Bill

Contributed to:

DAC 20132013
DATE 20122012
DATE DF 20042004
DATE v2 20042004

Wrote 4 papers:

DAC-2013-JiangYXCE #3d #effectiveness #on the #performance
On effective and efficient in-field TSV repair for stacked 3D ICs (LJ, FY, QX, KC, BE), p. 6.
DATE-2012-JiangXE #3d #effectiveness #on the
On effective TSV repair for 3D-stacked ICs (LJ, QX, BE), pp. 793–798.
DATE-DF-2004-Eklow #question #testing
IP Testing — The Future Differentiator? (BE), pp. 6–9.
DATE-v2-2004-SunterOCJBEBB #standard #testing
Status of IEEE Testability Standards 1149.4, 1532 and 1149.6 (SKS, AO, AC, NJ, DB, BE, CB, BB), pp. 1184–1191.

Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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