Travelled to:1 × France
1 × USA
Collaborated with:S.Huang Y.Lin K.Tsai W.Cheng Y.Chou D.Kwai A.Osseiran A.Cron N.Jacobson D.Bonnett B.Eklow C.Barnhart B.Bennetts
Talks about:standard (1) testabl (1) status (1) small (1) delay (1) tsvs (1) test (1) ieee (1)
Person: Stephen K. Sunter
DBLP: Sunter:Stephen_K=
Contributed to:
2012
2004Wrote 2 papers:
- DAC-2012-HuangLTCSCK #3d #testing
- Small delay testing for TSVs in 3-D ICs (SYH, YHL, KHT, WTC, SKS, YFC, DMK), pp. 1031–1036.
- DATE-v2-2004-SunterOCJBEBB #standard #testing
- Status of IEEE Testability Standards 1149.4, 1532 and 1149.6 (SKS, AO, AC, NJ, DB, BE, CB, BB), pp. 1184–1191.