Harald P. E. Vranken, Ferry Syafei Sapei, Hans-Joachim Wunderlich
Impact of Test Point Insertion on Silicon Area and Timing during Layout
DATE, 2004.
@inproceedings{DATE-v2-2004-VrankenSW,
author = "Harald P. E. Vranken and Ferry Syafei Sapei and Hans-Joachim Wunderlich",
booktitle = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe, Volume 2}",
doi = "10.1109/DATE.2004.1268981",
isbn = "0-7695-2085-5",
pages = "810--815",
publisher = "{IEEE Computer Society}",
title = "{Impact of Test Point Insertion on Silicon Area and Timing during Layout}",
year = 2004,
}











