Rosa Rodríguez-Montañés, Joan Figueras
Analysis of Bridging Defects in Sequential CMOS Circuits and their Current Testability
DATE, 1994.
@inproceedings{EDAC-1994-Rodriguez-MontanesF,
author = "Rosa Rodríguez-Montañés and Joan Figueras",
booktitle = "{Proceedings of the European Conference on Design Automation (EDAC), European Test Conference (ETC) and the European Event in ASIC Design (EUROASIC)}",
isbn = "0-8186-5410-4",
pages = "356--360",
publisher = "{IEEE Computer Society}",
title = "{Analysis of Bridging Defects in Sequential CMOS Circuits and their Current Testability}",
year = 1994,
}