Viera Stopjaková, Hans A. R. Manhaeve
CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits
DATE, 1997.
@inproceedings{EDTC-1997-StopjakovaM, author = "Viera Stopjaková and Hans A. R. Manhaeve", booktitle = "{Proceedings of the Second European Design and Test Conference}", doi = "10.1109/EDTC.1997.582369", pages = "266--270", publisher = "{IEEE}", title = "{CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits}", year = 1997, }