Travelled to:2 × France
2 × Germany
Collaborated with:B.Straka M.Svajda V.Stopjaková M.Sidiropulos J.Brenkus S.Kerckenaere J.Vanneuville
Talks about:iddq (5) chip (4) monitor (3) measur (3) off (3) current (2) unit (2) test (2) cmos (2) transient (1)
Person: Hans A. R. Manhaeve
DBLP: Manhaeve:Hans_A=_R=
Contributed to:
2008199919981997Wrote 6 papers:
- DATE-2008-StrakaMBK #aspect-oriented #metric #quality
- Theoretical and Practical Aspects of IDDQ Settling-Impact on Measurement Timing and Quality (BS, HARM, JB, SK), pp. 1310–1315.
- DATE-1999-StopjakovaMS #monitoring #testing
- On-Chip Transient Current Monitor for Testing of Low Voltage CMOS IC (VS, HARM, MS), pp. 538–542.
- DATE-1998-StrakaMVS #metric
- A Fully Digital Controlled Off-Chip IDDQ Measurement Unit (BS, HARM, JV, MS), pp. 495–500.
- DATE-1998-SvajdaSM #metric #named
- IOCIMU — An Integrated Off-Chip IDDQ Measurement Unit (MS, BS, HARM), pp. 959–960.
- EDTC-1997-StopjakovaM #monitoring #testing
- CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits (VS, HARM), pp. 266–270.
- EDTC-1997-SvajdaSM #monitoring
- A monolithic off-chip IDDQ monitor (MS, BS, HARM), p. 629.