B. Muralikrishnan, K. Najarian, J. Raja
Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application
ICPR, 2002.
@inproceedings{ICPR-v1-2002-MuralikrishnanNR,
author = "B. Muralikrishnan and K. Najarian and J. Raja",
booktitle = "{Proceedings of the 16th International Conference on Pattern Recognition, Volume 1}",
doi = "10.1109/ICPR.2002.1044581",
isbn = "0-7695-1695-5",
pages = "29--32",
publisher = "{IEEE Computer Society}",
title = "{Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application}",
year = 2002,
}











